Point-by-point compositional analysis for atom probe tomography

نویسندگان

  • Leigh T. Stephenson
  • Anna V. Ceguerra
  • Tong Li
  • Tanaporn Rojhirunsakool
  • Soumya Nag
  • Rajarshi Banerjee
  • Julie M. Cairney
  • Simon P. Ringer
چکیده

This new alternate approach to data processing for analyses that traditionally employed grid-based counting methods is necessary because it removes a user-imposed coordinate system that not only limits an analysis but also may introduce errors. We have modified the widely used "binomial" analysis for APT data by replacing grid-based counting with coordinate-independent nearest neighbour identification, improving the measurements and the statistics obtained, allowing quantitative analysis of smaller datasets, and datasets from non-dilute solid solutions. It also allows better visualisation of compositional fluctuations in the data. Our modifications include:.•using spherical k-atom blocks identified by each detected atom's first k nearest neighbours.•3D data visualisation of block composition and nearest neighbour anisotropy.•using z-statistics to directly compare experimental and expected composition curves. Similar modifications may be made to other grid-based counting analyses (contingency table, Langer-Bar-on-Miller, sinusoidal model) and could be instrumental in developing novel data visualisation options.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Compositional analysis of Si nanostructures: SIMS–3D tomographic atom probe comparison

3D atom probe tomography (APT) is introduced as a powerful compositional and spatial analytical tool for SiGe nanostructures. Compositional analysis of SiGe structures demonstrates that the location and identity of Si, Ge and B atoms can be detected in three dimensions. Superior sensitivity at Si–SiGe–Si interfaces is specifically witnessed by both the quantification of Ge accumulation at an in...

متن کامل

Atom Probe Tomography Investigations of Modi ed Early Stage Clustering in Si-Containing Aluminum Alloys

In this paper atom probe tomography is used to explore early stage clustering in aluminum alloys. Two novel concepts for a modi cation of clustering are discussed. Control of early stage clustering is welcome from an application point of view since clustering deteriorates strength evolution during the industrial heat treatment of the important class of Al Mg Si precipitation-hardenable alloys. ...

متن کامل

Dopant measurements in semiconductors with atom probe tomography

The capability of atom probe tomography to make useful measurements of dopant distribution single device geometry is explored by characterizing the compositional accuracy of reconstructed data sets. The objective of this analysis is to evaluate whether atom probe can provide measurements to guide a predictive model development for diffusion in device geometry and strain conditions. Simple measu...

متن کامل

Data Intensive Imaging for 3D Atom Probe

Atom Probe Tomography (APT) combines atomic imaging with a time-of-flight mass spectrometer to provide direct space three-dimensional, atomic-scale resolution images of materials with the chemical identities of all the detected atoms. Quantitative analysis of APT data through advanced data mining methods enhances the chemical characterization of alloy systems and accounts for the statistical un...

متن کامل

Breaking the icosahedra in boron carbide.

Findings of laser-assisted atom probe tomography experiments on boron carbide elucidate an approach for characterizing the atomic structure and interatomic bonding of molecules associated with extraordinary structural stability. The discovery of crystallographic planes in these boron carbide datasets substantiates that crystallinity is maintained to the point of field evaporation, and character...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره 1  شماره 

صفحات  -

تاریخ انتشار 2014